QRT provides solutions and expertise in:
• Reliability / High Temperature Operation Life (HTOL) Test
• Mechanical Test
• Highly Accelerated Stress Test (HAST)
• Highly Accelerated Life Test (HALT)
• LED, CIS, MEMS Device Reliability Test
• Failure Analysis and Highresolution Imaging
• Material Analysis and Circuit Modification
• Chemical and Forensic Analysis
• Reverse Engineering
• Radiation Test for SoC, Memory and Power Device
We QRT provide globally accepted and recognized Test Certification which is fully compliant with various international safety and reliability standards, such as ISO 26262-2018 Functional Safety and AEC Q100 for Electric/Electronic parts for automotive industries. We also have a dedicated team of highly experienced engineers and technologists to offer technical training and educational services in the U.S, China, and Korea.
Rad. Effects Char. & Tol. Testing of Semicond. Devices w/ Femtosec. Laser Systems. Saqib Khan, Ph.D.
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Challenges and Improvements in Accelerated Radiation Testing Kiseog Kim, Ph.D., Head of R&D, QRT Inc
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Recent Trends in the Development of Space-Grade Semiconductors & Single Event Effect Testing Woo Jun
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Introduction to QRT's Advanced Radiation Test & Data Analysis System Sung Chung QRT Korea Inc, Korea
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Proton and Neutron Radiation Tests: Making the Most of Your Beam Time Camille Belanger Champagne PhD
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Femto-second Laser System for General Purpose Radiation Test And Analysis Richard Sharp PhD, Radtest
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Design Considerations for DRAM SSDs in Automotive Functional Safety Applications |Keith Kim,SK hynix
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Functional Safety and Radiation Effects Considerations for AV Systems |Jyotika Athavale, PhD, NVIDIA
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